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1 article(s) from Alexander, John

Single-pass Kelvin force microscopy and dC/dZ measurements in the intermittent contact: applications to polymer materials

Sergei Magonov and
John Alexander

Beilstein J. Nanotechnol. 2011, 2, 15–27, doi:10.3762/bjnano.2.2

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Figure 1: Sketch illustrating implementation of Kelvin force microscopy in the AM–FM mode. Two servo-loops, w...

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Figure 2: A – Graph showing a temporal change of amplitude and phase of the AFM probe on approach to a sample...

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Figure 3: Topography and surface potential images of F₁₄H₂₀ self-assemblies on Si substrate. The images in A ...

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Figure 4: Topography, surface potential and dC/dZ images and cross-section plots obtained on a domain of F₁₄H...

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Figure 5: Topography and surface potential images recorded on two Bi/Sn samples. The images in A were obtaine...

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Figure 6: Topography and surface potential images of the films of a latex blend of poly(n-butyl acrylate) and...

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Figure 7: Topography and surface potential images, which were recorded at the scratch location in PS films of...

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Figure 8: Topography and surface potential images of films of PS/PMMA blends on a Si substrate. The images in ...

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Figure 9: Topography, phase, surface potential and dC/dZ images of an 80 nm thick film of PVAC/PS blend on IT...

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Figure 10: Topography, surface potential and dC/dZ (amplitude and phase) images of 80 nm thick film of PVAC/PS...

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Full Research Paper

Published 06 Jan 2011

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